Broadband Measurement of Asymmetric Coupled Lines Built in a 0.25 µm CMOS Process

Uwe Arz, Dylan F. Williams, David K. Walker, Janet E. Rogers, Markus Rudack, Dieter Treytnar, Hartmut Grabinski

Broadband Measurement of Asymmetric Coupled Lines Built in a 0.25 µm CMOS Process

Abstract
This paper examines the properties of asymmetric coupled lines built in a 0.25 um CMOS technology over the frequency range of 50 MHz to 26.5 GHz. We show that the frequency-dependent line parameters extracted from calibrated four-port scattering-parameter measurements agree well with numerical predictions.

This paper has been published in:

4th IEEE Workshop on Signal Propagation on Interconnects, 2000, 16-19 May, Magdeburg, Germany

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